Simulation of Electron Emission from Surfaces of Objects Exposed to Ionizing Radiation
Authors: Zhukovskii M.Ye., Skachkov M.V. | Published: 24.02.2014 |
Published in issue: #4(35)/2009 | |
DOI: | |
Category: Physics | |
Keywords: electron emission, statistical simulation, gamma radiation, electron recording, information importance |
A statistical algorithm is offered for simulation of electron emission from external and internal boundary surfaces of objects exposed to X-ray and gamma radiation. The basis for the developed simulation method is the principle of maximal informational usefulness of photon paths. Semi-analytical modifications of the Monte-Carlo method are constructed in which some random quantities are replaced by their probable values. In part, a process of emerging of fast electrons, born as a result of interaction of photon emission with the substance, is considered as a determinate process rather than a random event. Here a statistical weight of an electron is calculated with the help of building products of conditional probabilities. An original algorithm to record (detect) electrons escaping the object boundary surfaces is constructed which is adequately universal to be applied in practice. The developed method of simulation of the described processes is implemented in a form of the parallel code for computations using multiprocessor computers.