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Influence of Recombination Processes on the Temperature Dependence of the Current-Voltage Characteristics of pSi--n(Si2)1 -- x(CdS)x-Structures

Authors: Madaminov Kh.M. Published: 06.06.2025
Published in issue: #2(119)/2025  
DOI:

 
Category: Physics | Chapter: Condensed Matter Physics  
Keywords: liquid-phase epitaxy, exponential region, recombination model, ohmic relaxation, diffusion mechanism, drift mechanism, injection detector

Abstract

KeywordsAs a result of the analysis of the volt-ampere characteristics of p--n structures based on solid solutions of silicon with cadmium sulfide in the temperature range of 293--463 K, the importance of the influence of recombination processes is determined in the article. It is shown that the volt-ampere characteristics of these structures consist of several specific sites. The first section is satisfactorily described by linear dependence, the second and third sections by exponential dependence. The appearance of the exponential section is the result of the implementation of the long diode mode, which was first determined by V.I. Stafeev. The parameters calculated in this mode made it possible to determine the significant role of the resistivity of the n(Si2)1 -- x(CdS)x transition layer in the formation of the electrophysical properties of the studied structures. The results of the analysis of the third section of the volt-ampere characteristics led to the conclusion that the diffusion mechanism plays a significant role in the formation of the electrophysical properties of solid solutions (Si2)1 -- x(CdS)x (0 ≤ x ≤ 0.01). However, as the temperature increases, this mechanism gradually turns into a drift one. Thus, the results obtained confirm the importance of the resistivity of the transition layer and the diffusion mechanism in the formation of the electrical properties of such structures. It is recommended to use (Si2)1 -- x(CdS)x solid solutions as active detector elements, especially in injection mode and in the creation of temperature-dependent optical systems for recording background signals and spectra of metals and their alloys

Please cite this article in English as:

Madaminov Kh.M. Influence of recombination processes on the temperature dependence of the current-voltage characteristics of pSi--n(Si2)1 -- x(CdS)x-structures. Herald of the Bauman Moscow State Technical University, Series Natural Sciences, 2025, no. 2 (119), pp. 35--51 (in Russ.). EDN: JBOXKK

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