Search by keyword: "recombination model"
Influence of Recombination Processes on the Temperature Dependence of the Current-Voltage Characteristics of pSi--n(Si2)1 -- x(CdS)x-Structures
| Authors: Madaminov Kh.M. | Published: 06.06.2025 |
| Published in issue: #2(119)/2025 | |
| DOI: | |
| Category: Physics | Chapter: Condensed Matter Physics | |
| Keywords: liquid-phase epitaxy, exponential region, recombination model, ohmic relaxation, diffusion mechanism, drift mechanism, injection detector | |
Charge Transport Mechanism in p--Si--n--(Si2)1--x(CdS)x Semiconductor Structures
| Authors: Zaynabidinov S.Z., Madaminov Kh.M. | Published: 08.08.2020 |
| Published in issue: #4(91)/2020 | |
| DOI: 10.18698/1812-3368-2020-4-58-72 | |
| Category: Physics | Chapter: Condensed Matter Physics | |
| Keywords: solid solution, current-voltage characteristic, mobility, injection, recombination model, drift current mechanism | |